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Environmental conditions have a great effect on the functionality and reliability of electronic components, devices, and systems. In order to discover latent weaknesses in the shortest possible time, a typical temperature test is often insufficient; test specimens must be subjected to multiple, abrupt temperature changes.
With our ShockEvent series, extremely fast temperature changes in the range from -80 °C to +220 °C can be realised. For this purpose, we offer solutions in the form of the damper shock test chamber, with stationary test space and including the ambient temperature for 3-zone tests, or the classic vertical shock test chamber equipped with a mobile lifting cage. So that you can reduce early failures and increase the reliability of your products. Reproducible, certified and time-lapse.